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Abstract
The CRK gene TaCRK10 from wheat variety Xiaoyan 6 is associated with high-temperature seedling-plant resistance to stripe rust caused by the fungus Puccinia striiformis.
- TaCRK10 expression increases following Pst inoculation and high temperature treatment.
- Knockdown of TaCRK10 reduces wheat resistance to Pst at high temperatures but does not affect pathogen development or host responses at normal temperatures.
- Overexpression of TaCRK10 in a susceptible wheat variety boosts resistance under normal temperatures, linked to increased reactive oxygen species and activation of defense-related genes.
- TaCRK10 interacts with and phosphorylates the histone variant TaH2A.1, which positively influences wheat resistance to Pst.
- TaCRK10 may act as a key sensor for Pst infection and high temperatures, regulating wheat resistance through nuclear processes.
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